Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

G Lorito; L Qi; LK Nanver

doi:10.1109/ICMTS.2011.5976870

Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

G Lorito, L Qi, LK Nanver

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proc. of IEEE International Conference on Microelectronic Test Structures (ICMTS 2011)
Editors	J Schmitz, L Selmi
Place of Publication	Amsterdam, The Netherlands
Publisher	IEEE
Pages	108-113
Number of pages	6
ISBN (Print)	978-1-4244-8527-7
DOIs	https://doi.org/10.1109/ICMTS.2011.5976870
Publication status	Published - 2011
Event	IEEE ICMTS 2011 - Amsterdam, The Netherlands Duration: 4 Apr 2011 → 7 Apr 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	IEEE ICMTS 2011
Period	4/04/11 → 7/04/11

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

10.1109/ICMTS.2011.5976870

Cite this

@inproceedings{6e01ed4d46c142b7a7e69a9e6d0ddb72,

title = "Lateral bipolar structures for evaluating the effectiveness of surface doping techniques",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "G Lorito and L Qi and LK Nanver",

year = "2011",

doi = "10.1109/ICMTS.2011.5976870",

language = "English",

isbn = "978-1-4244-8527-7",

publisher = "IEEE",

pages = "108--113",

editor = "J Schmitz and L Selmi",

booktitle = "Proc. of IEEE International Conference on Microelectronic Test Structures (ICMTS 2011)",

address = "United States",

note = "IEEE ICMTS 2011 ; Conference date: 04-04-2011 Through 07-04-2011",

}

Lateral bipolar structures for evaluating the effectiveness of surface doping techniques. / Lorito, G; Qi, L; Nanver, LK.
Proc. of IEEE International Conference on Microelectronic Test Structures (ICMTS 2011). ed. / J Schmitz; L Selmi. Amsterdam, The Netherlands: IEEE, 2011. p. 108-113.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

AU - Lorito, G

AU - Qi, L

AU - Nanver, LK

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/ICMTS.2011.5976870

DO - 10.1109/ICMTS.2011.5976870

M3 - Conference contribution

SN - 978-1-4244-8527-7

SP - 108

EP - 113

BT - Proc. of IEEE International Conference on Microelectronic Test Structures (ICMTS 2011)

A2 - Schmitz, J

A2 - Selmi, L

PB - IEEE

CY - Amsterdam, The Netherlands

T2 - IEEE ICMTS 2011

Y2 - 4 April 2011 through 7 April 2011

ER -