Lateral Inverse Proximity Effect in Ti/Au Transition Edge Sensors

K. Nagayoshi*, M. de Wit, E. Taralli, S. Visser, M. L. Ridder, L. Gottardi, H. Akamatsu, D. Vaccaro, J. R. Gao, More Authors

*Corresponding author for this work

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Abstract

We report measured Tc of superconducting Ti/Au bilayer strips with a width W varying from 5 to 50 µm. The strips were fabricated based on a Ti/Au bilayer that consists of a 41-nm-thick Ti layer to which a 280-nm-thick Au layer was added. We find that the Tc drops as W decreases and the declining trend almost perfectly follows Tc/ [mK] = - 738.4 [μ m] 2/ W2+ 91.0 , where Tc(W= ∞) of 91 mK is consistent with the intrinsic Tc of the bilayer. The result is interpreted as a consequence of the lateral inverse proximity effect originated in normal-metal microstructures, namely Au overhangs that exist at the edges of the Ti/Au bilayer. The Tc shift from the intrinsic Tc should be anticipated in addition to the longitudinal proximity effect from superconducting Nb leads when one designs Ti/Au TESs.

Original languageEnglish
Pages (from-to)540-547
JournalJournal of Low Temperature Physics
Volume209
Issue number3-4
DOIs
Publication statusPublished - 2022

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Athena
  • Bilayer
  • Microcalorimeter
  • Proximity effect
  • TES
  • Ti/Au
  • X-IFU
  • X-ray

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