Leakage current modeling of test structures for characterization of dark current in CMOS image sensors

NV Loukianova, H-O Folkerts, JPV Maas, DWE Verbugt, AJ Mierop, W Hoekstra, E Roks, AJP Theuwissen

Research output: Contribution to journalArticlepeer-review

89 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)77-83
Number of pages7
JournalIEEE Transactions on Electron Devices
Issue number1
Publication statusPublished - 2003


  • ZX CWTS 1.00 <= JFIS < 3.00

Cite this