Abstract
This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.
| Original language | English |
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| Title of host publication | Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria |
| Editors | LJ Ernst, GQ Zhang, WD van Driel, P Rodgers, C Bailey, O de Saint Leger |
| Place of Publication | Linz, Austria |
| Publisher | IEEE Society |
| Pages | 1-5 |
| Number of pages | 5 |
| ISBN (Print) | 978-1-4577-0105-4 |
| Publication status | Published - 2011 |
| Event | EuroSimE 2011: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Linz, Austria Duration: 18 Apr 2011 → 20 Apr 2011 Conference number: 12 |
Publication series
| Name | |
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| Publisher | IEEE |
Conference
| Conference | EuroSimE 2011 |
|---|---|
| Country/Territory | Austria |
| City | Linz |
| Period | 18/04/11 → 20/04/11 |
Keywords
- conference contrib. refereed
- Conf.proc. > 3 pag