LED System Reliability

WD van Driel; CA Yuan; SW Koh; GQ Zhang

LED System Reliability

Computational Design and Mechanics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

33 Citations (Scopus)

Abstract

This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.

Original language	English
Title of host publication	Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria
Editors	LJ Ernst, GQ Zhang, WD van Driel, P Rodgers, C Bailey, O de Saint Leger
Place of Publication	Linz, Austria
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4577-0105-4
Publication status	Published - 2011
Event	EuroSimE 2011: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Linz, Austria Duration: 18 Apr 2011 → 20 Apr 2011 Conference number: 12

Publication series

Name
Publisher	IEEE

Conference

Conference	EuroSimE 2011
Country/Territory	Austria
City	Linz
Period	18/04/11 → 20/04/11

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

van Driel, WD., Yuan, CA., Koh, SW., & Zhang, GQ. (2011). LED System Reliability. In LJ. Ernst, GQ. Zhang, WD. V. Driel, P. Rodgers, C. Bailey, & O. D. Saint Leger (Eds.), Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria (pp. 1-5). IEEE.

van Driel, WD ; Yuan, CA ; Koh, SW et al. / LED System Reliability. Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria. editor / LJ Ernst ; GQ Zhang ; WD van Driel ; P Rodgers ; C Bailey ; O de Saint Leger. Linz, Austria : IEEE, 2011. pp. 1-5

@inproceedings{68948d2c09ab4fd08740105851973441,

title = "LED System Reliability",

abstract = "This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "\{van Driel\}, WD and CA Yuan and SW Koh and GQ Zhang",

year = "2011",

language = "English",

isbn = "978-1-4577-0105-4",

publisher = "IEEE",

pages = "1--5",

editor = "LJ Ernst and GQ Zhang and Driel, \{WD van\} and P Rodgers and C Bailey and \{Saint Leger\}, \{O de\}",

booktitle = "Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria",

address = "United States",

note = "EuroSimE 2011 : 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems ; Conference date: 18-04-2011 Through 20-04-2011",

}

van Driel, WD, Yuan, CA, Koh, SW & Zhang, GQ 2011, LED System Reliability. in LJ Ernst, GQ Zhang, WDV Driel, P Rodgers, C Bailey & OD Saint Leger (eds), Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria. IEEE, Linz, Austria, pp. 1-5, EuroSimE 2011, Linz, Austria, 18/04/11.

LED System Reliability. / van Driel, WD; Yuan, CA; Koh, SW et al.
Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria. ed. / LJ Ernst; GQ Zhang; WD van Driel; P Rodgers; C Bailey; O de Saint Leger. Linz, Austria: IEEE, 2011. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - LED System Reliability

AU - van Driel, WD

AU - Yuan, CA

AU - Koh, SW

AU - Zhang, GQ

N1 - Conference code: 12

PY - 2011

Y1 - 2011

N2 - This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.

AB - This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

UR - http://www.eurosime.org

UR - https://www.scopus.com/pages/publications/79957904230

M3 - Conference contribution

SN - 978-1-4577-0105-4

SP - 1

EP - 5

BT - Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria

A2 - Ernst, LJ

A2 - Zhang, GQ

A2 - Driel, WD van

A2 - Rodgers, P

A2 - Bailey, C

A2 - Saint Leger, O de

PB - IEEE

CY - Linz, Austria

T2 - EuroSimE 2011

Y2 - 18 April 2011 through 20 April 2011

ER -

van Driel WD, Yuan CA, Koh SW, Zhang GQ. LED System Reliability. In Ernst LJ, Zhang GQ, Driel WDV, Rodgers P, Bailey C, Saint Leger OD, editors, Proceedings of the 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011, 18-20 April 2011, Linz, Austria. Linz, Austria: IEEE. 2011. p. 1-5

LED System Reliability

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