Abstract
Traditional charge-based memories such as dynamic RAM (DRAM) and flash are facing more and more manufacturing, reliability, energy, and speed issues. A growing group of emerging memory technologies, such resistive RAM (RRAM), spin-transfer torque magnetic RAM (STT-MRAM), phase change memory (PCM), and Ferroelectric (Fe) devices (e.g., FeFET, FeRAM), address these problems. Nonetheless, these technologies are also not perfect, and thus special care must be taken to ensure that the lifecycle management, from design to obsolescence, of these memories is as optimal as possible. Lifecycle management is being developed for traditional technologies, but these are not optimized for emerging memories yet. In this paper, we present the first steps of lifecycle management for emerging memories. We analyze the different lifecycle phases that exist for two case studies on RRAM and FeFET-based memories. In this analysis, we identify how the phases affect each other and which optimizations are possible by analyzing the complete lifecycle. Finally, we compare the lifecycle phases of these two emerging memories to see how a unified approach can be developed.
Original language | English |
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Title of host publication | Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024 |
Publisher | IEEE |
ISBN (Electronic) | 9798350349320 |
DOIs | |
Publication status | Published - 2024 |
Event | 29th IEEE European Test Symposium, ETS 2024 - The Hague, Netherlands Duration: 20 May 2024 → 24 May 2024 |
Publication series
Name | Proceedings of the European Test Workshop |
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ISSN (Print) | 1530-1877 |
ISSN (Electronic) | 1558-1780 |
Conference
Conference | 29th IEEE European Test Symposium, ETS 2024 |
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Country/Territory | Netherlands |
City | The Hague |
Period | 20/05/24 → 24/05/24 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- emerging memory
- FeFET
- lifecycle management
- PCM
- RRAM
- STT-MRAM