| Original language | English |
|---|---|
| Pages (from-to) | 138-142 |
| Number of pages | 5 |
| Journal | Microelectronics Reliability |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2014 |
Bibliographical note
HarvestKeywords
- CWTS JFIS < 0.75
M Yazdan Mehr, WD van Driel, KMB Jansen, P Deeben, GQ Zhang
Research output: Contribution to journal › Article › Scientific › peer-review
| Original language | English |
|---|---|
| Pages (from-to) | 138-142 |
| Number of pages | 5 |
| Journal | Microelectronics Reliability |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2014 |