Lifetime reliability assessment with aging information from low-level sensors

Y Wang, SD Cotofana, L Fang

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the 23rd ACM International Conference on Great Lakes Symposium on VLSI
EditorsJ Ayala
Place of PublicationNew York, NY, USA
PublisherAssociation for Computing Machinery (ACM)
Pages339-340
Number of pages2
ISBN (Print)978-1-4503-2032-0
DOIs
Publication statusPublished - 2013
EventGLSVLSI 2013, Paris, France - New York, NY, USA
Duration: 2 May 20133 May 2013

Publication series

Name
PublisherACM

Conference

ConferenceGLSVLSI 2013, Paris, France
Period2/05/133/05/13

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