Light scattering properties of surface-textured substrates

K Jaeger, O Isabella, L Zhao, M Zeman

Research output: Contribution to journalArticleScientificpeer-review

30 Citations (Scopus)

Abstract

Light trapping in state-of-the-art thin-film silicon solar cells is accomplished by scattering of light at rough interfaces. Further enhancement of light absorption in the absorber layers can be achieved by optimizing the scattering via designing the morphology of these interfaces. The haze parameter and the angular intensity distribution of the scattered light were measured. The angular intensity measurements were carried out with variable angle spectrometry, allowing wavelengths in the visible and near infrared range. The measurements revealed new insights regarding the strong effects of the substrate surface roughness and morphology on the wavelength dependent variations of the angular intensity distribution.
Original languageEnglish
Pages (from-to)945-948
Number of pages4
JournalPhysica Status Solidi. C: Current Topics in Solid State Physics
Volume7
Issue number3-4
DOIs
Publication statusPublished - 2010

Keywords

  • professional journal papers
  • Vakpubl., Overig wet. > 3 pag

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