Line broadening analysis using integral breadth methods: a critical review

P Scardi, M Leoni, R Delhez

    Research output: Contribution to journalArticleScientificpeer-review

    268 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)381-390
    Number of pages10
    JournalJournal of Applied Crystallography
    Volume37
    Publication statusPublished - 2004

    Keywords

    • ZX CWTS 1.00 <= JFIS < 3.00

    Cite this