Linearity Research of A CMOS Image Sensor

Fei Wang

doi:10.4233/uuid:9d79cf6d-19a5-4f0f-a01e-6573f8e1b2ce

Linearity Research of A CMOS Image Sensor

Fei Wang

Electronic Instrumentation

Research output: Thesis › Dissertation (TU Delft)

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Abstract

This thesis provides a thorough analysis of the linearity characteristics of a CMOS image sensor. Firstly, this thesis analyzes the factors that cause the nonlinearity of the image sensors. These factors are then verified by simulation results of a proposed behavioral model and the measurements in a prototype chip. Secondly, different techniques are presented to improve the linearity of the whole imaging system; and the effectiveness of these techniques is further confirmed by measurement results of several test chips.

Original language	English
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Theuwissen, A.J.P.A.M., Supervisor
Award date	23 Oct 2018
Print ISBNs	978-94-028-1233-6
DOIs	https://doi.org/10.4233/uuid:9d79cf6d-19a5-4f0f-a01e-6573f8e1b2ce
Publication status	Published - 2018

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abstract = "This thesis provides a thorough analysis of the linearity characteristics of a CMOS image sensor. Firstly, this thesis analyzes the factors that cause the nonlinearity of the image sensors. These factors are then verified by simulation results of a proposed behavioral model and the measurements in a prototype chip. Secondly, different techniques are presented to improve the linearity of the whole imaging system; and the effectiveness of these techniques is further confirmed by measurement results of several test chips.",

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AB - This thesis provides a thorough analysis of the linearity characteristics of a CMOS image sensor. Firstly, this thesis analyzes the factors that cause the nonlinearity of the image sensors. These factors are then verified by simulation results of a proposed behavioral model and the measurements in a prototype chip. Secondly, different techniques are presented to improve the linearity of the whole imaging system; and the effectiveness of these techniques is further confirmed by measurement results of several test chips.

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M3 - Dissertation (TU Delft)

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Linearity Research of A CMOS Image Sensor

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