@article{0e67174aaf6d429db4ef844ce7644cd4,
title = "Linked faults in random access memories: concept fault models, test algorithms, and industrial results",
keywords = "academic journal papers, ZX CWTS JFIS < 1.00",
author = "S Hamdioui and Z Al-Ars and {van de Goor}, AJ and M Rodgers",
year = "2004",
language = "Undefined/Unknown",
volume = "23",
pages = "737--757",
journal = "IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems",
issn = "0278-0070",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
number = "5",
}