Linked faults in random access memories: concept fault models, test algorithms, and industrial results

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers

Research output: Contribution to journalArticleScientificpeer-review

44 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)737-757
Number of pages21
JournalIEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems
Issue number5
Publication statusPublished - 2004


  • academic journal papers
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