Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

N Matsuki; R Ishihara; T Chen; Y Hiroshima; JW Metselaar; CIM Beenakker

Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

N Matsuki, R Ishihara, T Chen, Y Hiroshima, JW Metselaar, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Digest of Technical papers of AM-FPD 07
Editors	s.n.
Place of Publication	Hogo, Japan
Publisher	Japan Society of Applied Physics
Pages	251-253
Number of pages	3
Publication status	Published - 2007

Publication series

Name
Publisher	The Japan Society of Applied Physics

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
Geen BTA classificatie

Cite this

@inproceedings{28b325956e32434397598fec7a8d73b4,

title = "Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Geen BTA classificatie",

author = "N Matsuki and R Ishihara and T Chen and Y Hiroshima and JW Metselaar and CIM Beenakker",

year = "2007",

language = "Undefined/Unknown",

publisher = "Japan Society of Applied Physics",

pages = "251--253",

editor = "s.n.",

booktitle = "Digest of Technical papers of AM-FPD 07",

address = "Japan",

}

Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy. / Matsuki, N; Ishihara, R; Chen, T et al.
Digest of Technical papers of AM-FPD 07. ed. / s.n. Hogo, Japan: Japan Society of Applied Physics, 2007. p. 251-253.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

AU - Matsuki, N

AU - Ishihara, R

AU - Chen, T

AU - Hiroshima, Y

AU - Metselaar, JW

AU - Beenakker, CIM

PY - 2007

Y1 - 2007

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - Geen BTA classificatie

M3 - Conference contribution

SP - 251

EP - 253

BT - Digest of Technical papers of AM-FPD 07

A2 - s.n., null

PB - Japan Society of Applied Physics

CY - Hogo, Japan

ER -