Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

N Matsuki, R Ishihara, T Chen, Y Hiroshima, JW Metselaar, CIM Beenakker

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationDigest of Technical papers of AM-FPD 07
Editors s.n.
Place of PublicationHogo, Japan
PublisherJapan Society of Applied Physics
Number of pages3
Publication statusPublished - 2007

Publication series

PublisherThe Japan Society of Applied Physics


  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Geen BTA classificatie

Cite this