Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceeding of The 14th International Display Workshops
EditorsY Nagae
Place of PublicationSapporo
PublisherThe Society of Information Display
Pages489-492
Number of pages4
Publication statusPublished - 2007

Publication series

Name
PublisherThe Society of Information Display
Name
Volume2

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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