Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

N Matsuki; R Ishihara; A Baiano; Y Hiroshima; S Inoue; CIM Beenakker

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

N Matsuki, R Ishihara, A Baiano, Y Hiroshima, S Inoue, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceeding of The 14th International Display Workshops
Editors	Y Nagae
Place of Publication	Sapporo
Publisher	The Society of Information Display
Pages	489-492
Number of pages	4
Publication status	Published - 2007

Publication series

Name
Publisher	The Society of Information Display

Name
Volume	2

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{421faa2763fd44d4901a07ae11992c99,

title = "Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "N Matsuki and R Ishihara and A Baiano and Y Hiroshima and S Inoue and CIM Beenakker",

year = "2007",

language = "Undefined/Unknown",

publisher = "The Society of Information Display",

pages = "489--492",

editor = "Y Nagae",

booktitle = "Proceeding of The 14th International Display Workshops",

}

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy. / Matsuki, N; Ishihara, R; Baiano, A et al.
Proceeding of The 14th International Display Workshops. ed. / Y Nagae. Sapporo: The Society of Information Display, 2007. p. 489-492.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

AU - Matsuki, N

AU - Ishihara, R

AU - Baiano, A

AU - Hiroshima, Y

AU - Inoue, S

AU - Beenakker, CIM

PY - 2007

Y1 - 2007

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 489

EP - 492

BT - Proceeding of The 14th International Display Workshops

A2 - Nagae, Y

PB - The Society of Information Display

CY - Sapporo

ER -