Localization microscopy at doubled precision with patterned illumination

Jelmer Cnossen, Taylor Hinsdale, Rasmus Thorsen, Marijn Siemons, Florian Schueder, Ralf Jungmann, Carlas S. Smith*, Bernd Rieger, Sjoerd Stallinga

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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