Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping

Mathijs W.H. Garming, Maarten Bolhuis, Sonia Conesa-Boj, Pieter Kruit, Jacob P. Hoogenboom

Research output: Contribution to journal › Article › Scientific › peer-review

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Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
Garming, M. W. H. (Creator), Bolhuis, M. (Creator), Conesa Boj, S. (Creator), Hoogenboom, J. P. (Creator) & Kruit, P. (Creator), TU Delft - 4TU.ResearchData, 14 Mar 2024
DOI: 10.4121/UUID:A7AF2E9F-6769-4E6D-8422-A7D698EF1115
Dataset/Software: Dataset