Logic BIST technology evaluation: an industrial case study

C Feige, MJ Geuzebroek

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ETW 2001: Informal Digest
Place of Publication	S.l.
Publisher	s.n.
Pages	333-340
Number of pages	8
Publication status	Published - 2001
Event	IEEE European Test Workshop, Stockholm - S.l. Duration: 29 May 2001 → 1 Jun 2001

Name
Publisher	S.n.

Conference	IEEE European Test Workshop, Stockholm
Period	29/05/01 → 1/06/01

Keywords

@inproceedings{1cc2248bb24347dabdefcaa45932097d,

title = "Logic BIST technology evaluation: an industrial case study",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "C Feige and MJ Geuzebroek",

year = "2001",

language = "Undefined/Unknown",

publisher = "s.n.",

pages = "333--340",

booktitle = "ETW 2001: Informal Digest",

note = "IEEE European Test Workshop, Stockholm ; Conference date: 29-05-2001 Through 01-06-2001",

}