Logical and topological testing of scrambled RAMs

I Schanstra, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationLATW 2003 Fourth IEEE Latin-American test workshop
Editors s.n.
Place of Publications.l.
Publishers.n.
Pages66-71
Number of pages6
Publication statusPublished - 2003
EventFourth IEEE Latin-American test workshop, Natal, Brazil - s.l.
Duration: 16 Feb 200319 Feb 2003

Publication series

Name
Publishers.n.

Conference

ConferenceFourth IEEE Latin-American test workshop, Natal, Brazil
Period16/02/0319/02/03

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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