Logical fault detection of CMOS SRAM ICs based on write quiescent supply current

M Hashizume, T Tamesada, T Koyama, AJ van de Goor Ph D

Research output: Contribution to journalArticleScientificpeer-review

Original languageUndefined/Unknown
Pages (from-to)906-915
Number of pages10
JournalDenshi Joho Tsushin Gakkai Ronbunshi. D-1/I EICE Transactions on Information and Systems, Pt.1
Issue number7
Publication statusPublished - 1999


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