Long-range ordering in anodic alumina films: a microradian X-ray diffraction study

KS Napolskii, IV Roslyakov, AA Eliseev, AV Petukhov, DV Byelov, NA Grigoryeva, WG Bouwman, AV Lukashin, KO Kvashnina, AP Chumakov, SV Grigoriev

Research output: Contribution to journalArticleScientificpeer-review

34 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)531-538
Number of pages8
JournalJournal of Applied Crystallography
Volume43
Publication statusPublished - 2010

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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