A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.
|Pages (from-to)||885 - 889|
|Number of pages||5|
|Journal||IEEE Transactions on Electromagnetic Compatibility|
|Publication status||Published - 2018|
- Electromagnetic interference (EMI)
- modified Cagniard technique
- pulsed electromagnetic (EM) field transfer
- time-domain (TD) analysis.