Low Noise p-channel JFETs for X-ray Spectroscopy with Silicon Drift Detectors

J Sonsky, R Koornneef, J Huizenga, LK Nanver, GW Lubking, RW Hollander, CWE van Eijk

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

2 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationBook of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France
Publication statusPublished - 2000


  • ZX Int.klas.verslagjaar < 2002

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