Low Noise p-channel JFETs for X-ray Spectroscopy with Silicon Drift Detectors

J Sonsky, R Koornneef, J Huizenga, LK Nanver, GW Lubking, RW Hollander, CWE van Eijk

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	Book of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France
Pages	109-109
Publication status	Published - 2000

Keywords

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title = "Low Noise p-channel JFETs for X-ray Spectroscopy with Silicon Drift Detectors",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J Sonsky and R Koornneef and J Huizenga and LK Nanver and GW Lubking and RW Hollander and {van Eijk}, CWE",

year = "2000",

language = "Undefined/Unknown",

pages = "109--109",

booktitle = "Book of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France",

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TY - CHAP

T1 - Low Noise p-channel JFETs for X-ray Spectroscopy with Silicon Drift Detectors

AU - Sonsky, J

AU - Koornneef, R

AU - Huizenga, J

AU - Nanver, LK

AU - Lubking, GW

AU - Hollander, RW

AU - van Eijk, CWE

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Chapter

SP - 109

EP - 109

BT - Book of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France

ER -