Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOS

A Zjajo, M.J. Barragan, J Pineda de Gyvez

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)

Original language	English
Pages (from-to)	2212-2221
Number of pages	10
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	61
Issue number	8
DOIs	https://doi.org/10.1109/TIM.2012.2184195
Publication status	Published - 2012

Keywords

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