Abstract
In this letter, we propose an analytical solution for recovering a low-rank positive semi-definite (PSD) matrix from its rank-one measurements. We show that by utilizing a set of structured measurement vectors, we can analytically determine the null space of this low-rank PSD matrix. Based on the result, the PSD matrix can be efficiently recovered. Our analysis shows that the proposed method only requires (N - K)(2K + 1)+ K 2 measurements to guarantee exact recovery of the PSD matrix, where N and K respectively denote the dimension and the rank of the PSD matrix. Numerical results show that the proposed method achieves a considerable improvement over existing state-of-the-art methods in terms of both sample complexity and computational efficiency. Specifically, the proposed method helps improve the computational efficiency by an order of magnitude as compared with existing methods.
| Original language | English |
|---|---|
| Pages (from-to) | 2674-2678 |
| Number of pages | 5 |
| Journal | IEEE Signal Processing Letters |
| Volume | 32 |
| DOIs | |
| Publication status | Published - 2025 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository as part of the Taverne amendment. More information about this copyright law amendment can be found at https://www.openaccess.nl. Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.Keywords
- covariance sketching
- Low-rank covariance matrix recovery
- rank-one measurements
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