Low stress states in triaxial tests observed using X-ray computed tomography

DJM Ngan-Tillard, XH Cheng, P Moutinho

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationAdvances in X-ray Tomography for Geomaterials
EditorsJ Desrues, G Viggiani, P Bésuelle
Place of PublicationLondon
PublisherISTE
Pages415-420
Number of pages6
ISBN (Print)1905209606
Publication statusPublished - 2006
Eventworkshop GeoX 2006 - London
Duration: 4 Oct 20067 Oct 2006

Publication series

Name
PublisherISTE

Conference

Conferenceworkshop GeoX 2006
Period4/10/067/10/06

Keywords

  • Conf.proc. > 3 pag

Cite this

Ngan-Tillard, DJM., Cheng, XH., & Moutinho, P. (2006). Low stress states in triaxial tests observed using X-ray computed tomography. In J. Desrues, G. Viggiani, & P. Bésuelle (Eds.), Advances in X-ray Tomography for Geomaterials (pp. 415-420). ISTE.