Abstract
Lumen decay of LEDs is affected by time, junction temperature and input current. In LED lamps, both temperature and input current vary with time due to driver's degradation and temperature change of lamps. This paper proposes a lumen decay prediction method which considers effects of operation time, temperature and current by taking the interaction of LED and driver performance into account. In particular, a lumen decay model for LED source with consideration of the ever changing current and temperature is developed and validated experimentally. Several scenarios are analyzed theoretically by applying different assumptions.
Original language | English |
---|---|
Title of host publication | 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 1-5 |
Number of pages | 5 |
ISBN (Electronic) | 978-1-5090-2106-2 |
DOIs | |
Publication status | Published - 18 Apr 2016 |
Event | EuroSimE 2016: 17th International Conference on Thermal Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Montpellier, France Duration: 17 Apr 2016 → 20 Apr 2016 Conference number: 17 https://www.eurosime.org/index.php/2016-montpellier/ |
Conference
Conference | EuroSimE 2016 |
---|---|
Country/Territory | France |
City | Montpellier |
Period | 17/04/16 → 20/04/16 |
Internet address |
Keywords
- Reliability
- LED Lamp
- Lumen Decay Prediction