Lumen Maintenance Predictions for LED Packages using LM80 data

W.D. van Driel, M. Schuld, B. Jacobs, F. Commissaris, J. van der Eyden, B. Hamon

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)

Abstract

Per today, commercial claims for LED-based products in terms of lumen maintenance are fully based on TM-21 extrapolations using LM80 data. There may be a risk in doing this as TM-21 only relies on the behavior of the average LED degradation, instead of taking into account the degradation of all individual LEDs. A more profound statistical analysis is required to make the step from TM-21 extrapolation to lumen maintenance on product level. This is needed as the commercial claims are used as input for service bids up to periods of 20 to 25 years of operation. This paper describes the different approaches currently available to perform lumen maintenance extrapolations. For that, we have analyzed several LM80 data sets from a statistical point of view.
Original languageEnglish
Title of host publication Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
Place of PublicationPiscataway, NJ
PublisherIEEE Society
Pages1-5
Number of pages5
ISBN (Print)978-1-4799-9949-1
DOIs
Publication statusPublished - 2015
EventEuroSimE 2015: 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Budapest, Hungary
Duration: 19 Apr 201522 Apr 2015
Conference number: 16
https://www.eurosime.org/index.php/2015-budapest/ (Conference program)
https://ieeexplore-ieee-org.tudelft.idm.oclc.org/servlet/opac?punumber=7095627 (Proceedings)

Conference

ConferenceEuroSimE 2015
Abbreviated titleEuroSimE 2015
CountryHungary
CityBudapest
Period19/04/1522/04/15
Internet address

Keywords

  • Light emitting diodes
  • Reliability
  • Fluorescence
  • Maintenance engineering
  • Degradation
  • Computational modeling
  • Standards

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