Original language | English |
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Pages (from-to) | 3870-3876 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
Volume | 60 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2013 |
Lumped models for assessment and optimization of bipolar device RF noise performance
F Vitale, R van der Toorn
Research output: Contribution to journal › Article › Scientific › peer-review