Lumped models for assessment and optimization of bipolar device RF noise performance

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	3870-3876
Number of pages	7
Journal	IEEE Transactions on Electron Devices
Volume	60
Issue number	11
DOIs	https://doi.org/10.1109/TED.2013.2281237
Publication status	Published - 2013

Harvest
Article number 6605569

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@article{cc0851fdfc9b44618ea09c9cfebbdd34,

title = "Lumped models for assessment and optimization of bipolar device RF noise performance",

author = "F Vitale and {van der Toorn}, R",

note = "Harvest Article number 6605569",

year = "2013",

doi = "10.1109/TED.2013.2281237",

language = "English",

volume = "60",

pages = "3870--3876",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "11",

}

TY - JOUR

T1 - Lumped models for assessment and optimization of bipolar device RF noise performance

AU - Vitale, F

AU - van der Toorn, R

N1 - Harvest Article number 6605569

PY - 2013

Y1 - 2013

U2 - 10.1109/TED.2013.2281237

DO - 10.1109/TED.2013.2281237

M3 - Article

VL - 60

SP - 3870

EP - 3876

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

SN - 0018-9383

IS - 11

ER -