Lumped models for assessment and optimization of bipolar device RF noise performance

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	3870-3876
Number of pages	7
Journal	IEEE Transactions on Electron Devices
Volume	60
Issue number	11
DOIs	https://doi.org/10.1109/TED.2013.2281237
Publication status	Published - 2013

Harvest
Article number 6605569

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title = "Lumped models for assessment and optimization of bipolar device RF noise performance",

author = "F Vitale and {van der Toorn}, R",

note = "Harvest Article number 6605569",

year = "2013",

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language = "English",

volume = "60",

pages = "3870--3876",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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}

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T1 - Lumped models for assessment and optimization of bipolar device RF noise performance

AU - Vitale, F

AU - van der Toorn, R

N1 - Harvest Article number 6605569

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DO - 10.1109/TED.2013.2281237

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VL - 60

SP - 3870

EP - 3876

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

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