Lumped models for assessment and optimization of bipolar device RF noise performance

F Vitale, R van der Toorn

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)3870-3876
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume60
Issue number11
DOIs
Publication statusPublished - 2013

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