TY - JOUR
T1 - Magnetic-proximity-induced magnetoresistance on topological insulators
AU - Chiba, Takahiro
AU - Takahashi, Saburo
AU - Bauer, Gerrit E.W.
PY - 2017/3/28
Y1 - 2017/3/28
N2 - We theoretically study the magnetoresistance (MR) of two-dimensional massless Dirac electrons as found on the surface of three-dimensional topological insulators (TIs) that are capped by a ferromagnetic insulator (FI). We calculate charge and spin transport by Kubo and Boltzmann theories, taking into account the ladder-vertex correction and the in-scattering due to normal and magnetic disorder. The induced exchange splitting is found to generate an electric conductivity that depends on the magnetization orientation, but its form is very different from both the anisotropic and the spin Hall MR. The in-plane MR vanishes identically for nonmagnetic disorder, while out-of-plane magnetizations cause a large MR ratio. On the other hand, we do find an in-plane MR and planar Hall effect in the presence of magnetic disorder aligned with the FI magnetization. Our results may help us understand recent transport measurements on TI|FI systems.
AB - We theoretically study the magnetoresistance (MR) of two-dimensional massless Dirac electrons as found on the surface of three-dimensional topological insulators (TIs) that are capped by a ferromagnetic insulator (FI). We calculate charge and spin transport by Kubo and Boltzmann theories, taking into account the ladder-vertex correction and the in-scattering due to normal and magnetic disorder. The induced exchange splitting is found to generate an electric conductivity that depends on the magnetization orientation, but its form is very different from both the anisotropic and the spin Hall MR. The in-plane MR vanishes identically for nonmagnetic disorder, while out-of-plane magnetizations cause a large MR ratio. On the other hand, we do find an in-plane MR and planar Hall effect in the presence of magnetic disorder aligned with the FI magnetization. Our results may help us understand recent transport measurements on TI|FI systems.
UR - http://resolver.tudelft.nl/uuid:d0a17232-9216-426b-ac52-7b861a805a45
UR - http://www.scopus.com/inward/record.url?scp=85016150654&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.95.094428
DO - 10.1103/PhysRevB.95.094428
M3 - Article
AN - SCOPUS:85016150654
VL - 95
JO - Physical Review B (Condensed Matter and Materials Physics)
JF - Physical Review B (Condensed Matter and Materials Physics)
SN - 1098-0121
IS - 9
M1 - 094428
ER -