Manifestation of precharge faults in high speed DRAM devices

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publication2007 IEEE workshop on Design and diagnostics of electronic circuits and systems
EditorsKrasniewski, E. Gramatova, E. Girard, P., Garbolina, T.
Place of PublicationPiscataway
PublisherIEEE Society
Pages179-184
Number of pages6
ISBN (Print)1-4244-1161-0
Publication statusPublished - 2007
EventDDECS'07 - Piscataway
Duration: 11 Apr 200713 Apr 2007

Publication series

Name
PublisherIEEE

Conference

ConferenceDDECS'07
Period11/04/0713/04/07

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag

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