| Original language | Undefined/Unknown |
|---|---|
| Patent number | PCT/NL/98/00297 |
| IPC | Aangevraagd in 1998. |
| Priority date | 1/01/00 |
| Publication status | Published - 1999 |
Mapper concept, a hybrid deep-UV and electron projection lithography system for the 0.1 mm.
P Kruit (Inventor)
Research output: Patent