March LA: A test for linked memory faults

A. J. van de Goor; G. N. Gaydadjiev; V. N. Yarmolik; V. G. Mikitjuk

March LA: A test for linked memory faults

A. J. van de Goor^*, G. N. Gaydadjiev, V. N. Yarmolik, V. G. Mikitjuk

^*Corresponding author for this work

Computer Engineering

Research output: Contribution to journal › Conference article › Scientific › peer-review

28 Citations (Scopus)

Abstract

A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.

Original language	English
Pages (from-to)	627
Number of pages	1
Journal	Proceedings of European Design and Test Conference
Publication status	Published - 1997
Event	Proceedings of the 1997 European Design & Test Conference - Paris, Fr Duration: 17 Mar 1997 → 20 Mar 1997

Cite this

@article{5a4ff241c985452ca6ca106b3cb000cc,

title = "March LA: A test for linked memory faults",

abstract = "A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.",

author = "{van de Goor}, {A. J.} and Gaydadjiev, {G. N.} and Yarmolik, {V. N.} and Mikitjuk, {V. G.}",

year = "1997",

language = "English",

pages = "627",

journal = "Proceedings of European Design and Test Conference",

issn = "1066-1409",

note = "Proceedings of the 1997 European Design & Test Conference ; Conference date: 17-03-1997 Through 20-03-1997",

}

TY - JOUR

T1 - March LA

T2 - Proceedings of the 1997 European Design & Test Conference

AU - van de Goor, A. J.

AU - Gaydadjiev, G. N.

AU - Yarmolik, V. N.

AU - Mikitjuk, V. G.

PY - 1997

Y1 - 1997

N2 - A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.

AB - A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.

UR - http://www.scopus.com/inward/record.url?scp=0030676725&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0030676725

SN - 1066-1409

SP - 627

JO - Proceedings of European Design and Test Conference

JF - Proceedings of European Design and Test Conference

Y2 - 17 March 1997 through 20 March 1997

ER -

March LA: A test for linked memory faults

Abstract

Other files and links

Fingerprint

Cite this