March tests for word-oriented two-port memories

S Hamdioui, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationEighth Asian Test Symposium: proceedings
Place of PublicationLos Alamitos
PublisherIEEE
Pages53-60
Number of pages8
ISBN (Print)0-7695-0315-2
Publication statusPublished - 1999
EventATS '99, Shanghai - Los Alamitos
Duration: 16 Nov 199918 Nov 1999

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceATS '99, Shanghai
Period16/11/9918/11/99

Keywords

  • ZX Int.klas.verslagjaar < 2002

Cite this

Hamdioui, S., & van de Goor Ph D, AJ. (1999). March tests for word-oriented two-port memories. In Eighth Asian Test Symposium: proceedings (pp. 53-60). IEEE.