March tests for word-oriented two-port memories

S Hamdioui, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (SciVal)

Original language	Undefined/Unknown
Title of host publication	Eighth Asian Test Symposium: proceedings
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	53-60
Number of pages	8
ISBN (Print)	0-7695-0315-2
Publication status	Published - 1999
Event	ATS '99, Shanghai - Los Alamitos Duration: 16 Nov 1999 → 18 Nov 1999

Name
Publisher	IEEE Computer Society

Conference	ATS '99, Shanghai
Period	16/11/99 → 18/11/99

Keywords

@inproceedings{bd50e9fe566e434392dde37037132429,

title = "March tests for word-oriented two-port memories",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "S Hamdioui and {van de Goor Ph D}, AJ",

year = "1999",

language = "Undefined/Unknown",

isbn = "0-7695-0315-2",

publisher = "IEEE",

pages = "53--60",

booktitle = "Eighth Asian Test Symposium: proceedings",

address = "United States",

note = "ATS '99, Shanghai ; Conference date: 16-11-1999 Through 18-11-1999",

}

TY - GEN

T1 - March tests for word-oriented two-port memories

AU - Hamdioui, S

AU - van de Goor Ph D, AJ

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0315-2

SP - 53

EP - 60

BT - Eighth Asian Test Symposium: proceedings

PB - IEEE

CY - Los Alamitos

T2 - ATS '99, Shanghai

Y2 - 16 November 1999 through 18 November 1999

ER -