Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks)

KRV Vaes; PJ Stappers; A. Standaert; E Cozzi

Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks)

KRV Vaes, PJ Stappers, A. Standaert, E Cozzi

Design Conceptualization and Communication

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 7th design and emotion conference 2010
Editors	J Gregory, K Sato, P Desmet
Place of Publication	s.l.
Publisher	Chicago IIT Institute of Design
Pages	1-14
Number of pages	14
Publication status	Published - 2010
Event	Proceedings of the 7th design and emotion conference 2010, Chicago, USA - s.l. Duration: 4 Oct 2010 → 7 Oct 2010

Publication series

Name
Publisher	Chicago IIT Institute of Design

Conference

Conference	Proceedings of the 7th design and emotion conference 2010, Chicago, USA
Period	4/10/10 → 7/10/10

Bibliographical note

NEO, geen isbn

Cite this

@inproceedings{fbe7ca23547741db9b8f248969d93111,

title = "Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks)",

author = "KRV Vaes and PJ Stappers and A. Standaert and E Cozzi",

note = "NEO, geen isbn; Proceedings of the 7th design and emotion conference 2010, Chicago, USA ; Conference date: 04-10-2010 Through 07-10-2010",

year = "2010",

language = "English",

publisher = "Chicago IIT Institute of Design",

pages = "1--14",

editor = "J Gregory and K Sato and P Desmet",

booktitle = "Proceedings of the 7th design and emotion conference 2010",

}

Vaes, KRV, Stappers, PJ, Standaert, A & Cozzi, E 2010, Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks). in J Gregory, K Sato & P Desmet (eds), Proceedings of the 7th design and emotion conference 2010. Chicago IIT Institute of Design, s.l., pp. 1-14, Proceedings of the 7th design and emotion conference 2010, Chicago, USA, 4/10/10.

Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks). / Vaes, KRV; Stappers, PJ; Standaert, A. et al.

Proceedings of the 7th design and emotion conference 2010. ed. / J Gregory; K Sato; P Desmet. s.l. : Chicago IIT Institute of Design, 2010. p. 1-14.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Masked emotions: Measuring implicit and explicit attitudes towards stigmatizing products (dust masks)

AU - Vaes, KRV

AU - Stappers, PJ

AU - Standaert, A.

AU - Cozzi, E

N1 - NEO, geen isbn

PY - 2010

Y1 - 2010

M3 - Conference contribution

SP - 1

EP - 14

BT - Proceedings of the 7th design and emotion conference 2010

A2 - Gregory, J

A2 - Sato, K

A2 - Desmet, P

PB - Chicago IIT Institute of Design

CY - s.l.

T2 - Proceedings of the 7th design and emotion conference 2010, Chicago, USA

Y2 - 4 October 2010 through 7 October 2010

ER -