Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy

S Lazar, GA Botton, MY Wu, FD Tichelaar, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    133 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)535-546
    Number of pages12
    JournalUltramicroscopy
    Volume96
    Issue number3-4
    Publication statusPublished - 2003

    Keywords

    • ZX CWTS 1.00 <= JFIS < 3.00

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