Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck, JH Chen

Research output: Contribution to journalArticleScientificpeer-review

61 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)107-125
Number of pages19
JournalUltramicroscopy
Volume104
Issue number2
Publication statusPublished - 2005

Keywords

  • ZX CWTS 1.00 <= JFIS < 3.00

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