Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: A practical example

S van Aert, AJ den Dekker, A van den Bos, D Van Dyck, JH Chen

Research output: Contribution to journalArticleScientificpeer-review

61 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)107-125
Number of pages19
Issue number2
Publication statusPublished - 2005


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