Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework

AJ den Dekker, S van Aert, A van den Bos

Research output: Contribution to journalArticleScientificpeer-review

77 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)83-106
Number of pages24
JournalUltramicroscopy
Volume104
Issue number2
Publication statusPublished - 2005

Keywords

  • ZX CWTS 1.00 <= JFIS < 3.00

Cite this