Measure-by-wire (MBW): An automatic control framework for high-throughput transmission electron microscopy

A Tejada Ruiz, W van den Broek, AJ den Dekker

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	291-346
Number of pages	56
Journal	Advances in Imaging and Electron Physics
Volume	179
DOIs	https://doi.org/10.1016/B978-0-12-407700-3.00005-3
Publication status	Published - 2013

harvest

Keywords

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title = "Measure-by-wire (MBW): An automatic control framework for high-throughput transmission electron microscopy",

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author = "{Tejada Ruiz}, A and {van den Broek}, W and {den Dekker}, AJ",

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AU - Tejada Ruiz, A

AU - van den Broek, W

AU - den Dekker, AJ

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PY - 2013

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SN - 1076-5670

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EP - 346

JO - Advances in Imaging and Electron Physics

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