Measured variable selection and nonlinear state estimation for MPC, with application to a high-density poly-ethylene reactor

RL Tousain, CWJ Hol, OH Bosgra

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the process control and instrumentation conference, July 26-28
Place of Publication	s.l.
Publisher	s.n.
Pages	1-6
Number of pages	6
Publication status	Published - 2000
Event	process control and instrumentation conference - s.l. Duration: 26 Jul 2000 → 28 Jul 2000

Name
Publisher	s,n.

Conference	process control and instrumentation conference
Period	26/07/00 → 28/07/00

Keywords

@inproceedings{b5fd4cb614f440ae9beec8e857ed217e,

title = "Measured variable selection and nonlinear state estimation for MPC, with application to a high-density poly-ethylene reactor",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "RL Tousain and CWJ Hol and OH Bosgra",

year = "2000",

language = "Undefined/Unknown",

publisher = "s.n.",

pages = "1--6",

booktitle = "Proceedings of the process control and instrumentation conference, July 26-28",

note = "process control and instrumentation conference ; Conference date: 26-07-2000 Through 28-07-2000",

}

Measured variable selection and nonlinear state estimation for MPC, with application to a high-density poly-ethylene reactor. / Tousain, RL; Hol, CWJ; Bosgra, OH.
Proceedings of the process control and instrumentation conference, July 26-28. s.l.: s.n., 2000. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Measured variable selection and nonlinear state estimation for MPC, with application to a high-density poly-ethylene reactor

AU - Tousain, RL

AU - Hol, CWJ

AU - Bosgra, OH

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 1

EP - 6

BT - Proceedings of the process control and instrumentation conference, July 26-28

PB - s.n.

CY - s.l.

T2 - process control and instrumentation conference

Y2 - 26 July 2000 through 28 July 2000

ER -