Measurement of dislocation distributions by means of X-ray diffraction.

J-D Kamminga, R Delhez

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	55-59
Number of pages	5
Journal	Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing
Volume	309-310
Publication status	Published - 2001

Keywords

@article{061c44d693f24b5bad677416fdfb95ae,

title = "Measurement of dislocation distributions by means of X-ray diffraction.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J-D Kamminga and R Delhez",

year = "2001",

language = "Undefined/Unknown",

volume = "309-310",

pages = "55--59",

journal = "Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing",

issn = "0921-5093",

publisher = "Elsevier",

}

TY - JOUR

T1 - Measurement of dislocation distributions by means of X-ray diffraction.

AU - Kamminga, J-D

AU - Delhez, R

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0921-5093

VL - 309-310

SP - 55

EP - 59

JO - Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing

JF - Materials Science and Engineering A: Structural Materials: Properties, Microstructures and Processing

ER -