Measurement of moisture migration kinetics in environmental scanning electron microscopy

X Tang; MR de Rooij

Measurement of moisture migration kinetics in environmental scanning electron microscopy

X Tang, MR de Rooij

Microlab

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

0982-KK07-10

Original language	Undefined/Unknown
Title of host publication	Symposium KK Electron microscopy across hard and soft materials
Editors	TJ Balk, A Minor, A Porter, J Plitzko
Place of Publication	Boston
Publisher	Materials Research Society
Pages	1-6
Number of pages	6
Publication status	Published - 2006
Event	2006 Fall meeting Materials research society - Boston Duration: 27 Nov 2006 → 1 Dec 2006

Publication series

Name
Publisher	Materials research society MRS

Conference

Conference	2006 Fall meeting Materials research society
Period	27/11/06 → 1/12/06

Bibliographical note

Unilever R&D in SENTER/IS/No.IS42042 neo

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{c2bbf039dd094194956c4fea9a6b0a79,

title = "Measurement of moisture migration kinetics in environmental scanning electron microscopy",

abstract = "0982-KK07-10",

keywords = "Conf.proc. > 3 pag",

author = "X Tang and {de Rooij}, MR",

note = "Unilever R&D in SENTER/IS/No.IS42042 neo; null ; Conference date: 27-11-2006 Through 01-12-2006",

year = "2006",

language = "Undefined/Unknown",

publisher = "Materials Research Society",

pages = "1--6",

editor = "TJ Balk and A Minor and A Porter and J Plitzko",

booktitle = "Symposium KK Electron microscopy across hard and soft materials",

address = "United States",

}

Measurement of moisture migration kinetics in environmental scanning electron microscopy. / Tang, X; de Rooij, MR.

Symposium KK Electron microscopy across hard and soft materials. ed. / TJ Balk; A Minor; A Porter; J Plitzko. Boston : Materials Research Society, 2006. p. 1-6.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Measurement of moisture migration kinetics in environmental scanning electron microscopy

AU - Tang, X

AU - de Rooij, MR

N1 - Unilever R&D in SENTER/IS/No.IS42042 neo

PY - 2006

Y1 - 2006

N2 - 0982-KK07-10

AB - 0982-KK07-10

KW - Conf.proc. > 3 pag

UR - http://www.mrs.org/s_mrs/doc.asp?CID=6982&DID=178418

M3 - Conference contribution

SP - 1

EP - 6

BT - Symposium KK Electron microscopy across hard and soft materials

A2 - Balk, TJ

A2 - Minor, A

A2 - Porter, A

A2 - Plitzko, J

PB - Materials Research Society

CY - Boston

Y2 - 27 November 2006 through 1 December 2006

ER -

Measurement of moisture migration kinetics in environmental scanning electron microscopy

Abstract

Publication series

Conference

Bibliographical note

Keywords

Other files and links

Cite this