Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

PCM Planken; HPM Pellemans; PC van Son; JN Hovenier; TO Klaassen; WT Wenckebach; PW Barmby; JL Dunn; CA Bates; CT Foxon; CJGM Langerak

Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

PCM Planken, HPM Pellemans, PC van Son, JN Hovenier, TO Klaassen, WT Wenckebach, PW Barmby, JL Dunn, CA Bates, CT Foxon, CJGM Langerak

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Pages (from-to)	258-262
Number of pages	5
Journal	Optics Communications
Volume	124
Publication status	Published - 1996

Cite this

@article{dc59a68463e74c7597c6e5521eefe6c5,

title = "Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation",

author = "PCM Planken and HPM Pellemans and {van Son}, PC and JN Hovenier and TO Klaassen and WT Wenckebach and PW Barmby and JL Dunn and CA Bates and CT Foxon and CJGM Langerak",

year = "1996",

language = "Undefined/Unknown",

volume = "124",

pages = "258--262",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier",

}

TY - JOUR

T1 - Measurement of the resonant-polaron effect in the reststrahlen band of GaAs:Si using two-photon excitation

AU - Planken, PCM

AU - Pellemans, HPM

AU - van Son, PC

AU - Hovenier, JN

AU - Klaassen, TO

AU - Wenckebach, WT

AU - Barmby, PW

AU - Dunn, JL

AU - Bates, CA

AU - Foxon, CT

AU - Langerak, CJGM

PY - 1996

Y1 - 1996

M3 - Article

SN - 0030-4018

VL - 124

SP - 258

EP - 262

JO - Optics Communications

JF - Optics Communications

ER -