Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

T.H.A. van der Reep, B.A. Looman, H.W. Chan, C.W. Hagen, H. van der Graaf

Research output: Contribution to journalArticleScientificpeer-review

6 Downloads (Pure)

Abstract

We measure the transmission secondary electron yield of nanometer-thick Al2O3/TiN/Al2O3 films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between 1.2 and 1.8 keV and found to be in the range of 0.1 (1.2 keV) to 0.9 (1.8 keV). These results are in agreement to data obtained by a different, independent method. We therefore conclude that the prototype TiPC is able to characterise the thin films in terms of transmission secondary electron yield. Additionally, observed features which are unrelated to the yield determination are interpreted.
Original languageEnglish
Article numberP10022
Number of pages12
JournalJournal of Instrumentation
Volume15
Issue number10
DOIs
Publication statusPublished - 2020

Keywords

  • Electron multipliers (vacuum)
  • Photon detectors for UV, visible and IR photons (vacuum) (photomultipliers, HPDs, others)
  • Timing detectors
  • Dynodes and Tynodes

Fingerprint Dive into the research topics of 'Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter'. Together they form a unique fingerprint.

Cite this