Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

T.H.A. van der Reep, B.A. Looman, H.W. Chan, C.W. Hagen, H. van der Graaf

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
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Abstract

We measure the transmission secondary electron yield of nanometer-thick Al2O3/TiN/Al2O3 films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between 1.2 and 1.8 keV and found to be in the range of 0.1 (1.2 keV) to 0.9 (1.8 keV). These results are in agreement to data obtained by a different, independent method. We therefore conclude that the prototype TiPC is able to characterise the thin films in terms of transmission secondary electron yield. Additionally, observed features which are unrelated to the yield determination are interpreted.
Original languageEnglish
Article numberP10022
Number of pages12
JournalJournal of Instrumentation
Volume15
Issue number10
DOIs
Publication statusPublished - 2020

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • Electron multipliers (vacuum)
  • Photon detectors for UV, visible and IR photons (vacuum) (photomultipliers, HPDs, others)
  • Timing detectors
  • Dynodes and Tynodes

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