Measurement of thin coatings in the confocal microscope

G. Cox, CJR Sheppard

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)701-705
Number of pages5
JournalMicron
Volume32
Issue number7
Publication statusPublished - 2001

Keywords

  • ZX CWTS JFIS < 1.00

Cite this

Cox, G., & Sheppard, CJR. (2001). Measurement of thin coatings in the confocal microscope. Micron, 32(7), 701-705.