Measuring absolute optical path differences with angstrom accuracy over ranges of millimeters.

RG Klaver, ML Krieg, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings Symposium IEEE/LEOS Benelux Chapter
EditorsXJM Leijtens, JH den Besten
Number of pages4
Publication statusPublished - 2000


  • ZX Int.klas.verslagjaar < 2002

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