Measuring (Oblique) Wave Run-Up and Overtopping with Laser Scanners

Patrick Oosterlo, Bas Hofland, Jentsje van der Meer, Maarten Overduin, Gosse Jan Steendam, Jan-Willem Nieuwenhuis, Gerbrant van Vledder, Henk Steetzel, Michiel Reneerkens

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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