Measuring the thermal diffusivity of CMOS chips

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of IEEE Sensors 2009
Editors	s.n.
Place of Publication	Christchurch, New Zealand
Publisher	IEEE
Pages	45-48
Number of pages	4
ISBN (Print)	978-1-4244-5335-1
Publication status	Published - 2009
Event	IEEE Sensors 2009 Conference - Christchurch, New Zealand Duration: 25 Oct 2009 → 28 Oct 2009

Name
Publisher	IEEE

Keywords

@inproceedings{823d54f77fab40b98991e797738ec648,

title = "Measuring the thermal diffusivity of CMOS chips",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "SM Kashmiri and KAA Makinwa",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-1-4244-5335-1",

publisher = "IEEE",

pages = "45--48",

editor = "s.n.",

booktitle = "Proceedings of IEEE Sensors 2009",

address = "United States",

note = "IEEE Sensors 2009 Conference ; Conference date: 25-10-2009 Through 28-10-2009",

}

TY - GEN

T1 - Measuring the thermal diffusivity of CMOS chips

AU - Kashmiri, SM

AU - Makinwa, KAA

PY - 2009

Y1 - 2009

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-5335-1

SP - 45

EP - 48

BT - Proceedings of IEEE Sensors 2009

A2 - s.n., null

PB - IEEE

CY - Christchurch, New Zealand

T2 - IEEE Sensors 2009 Conference

Y2 - 25 October 2009 through 28 October 2009

ER -