Measuring the thermal diffusivity of CMOS chips

SM Kashmiri, KAA Makinwa

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of IEEE Sensors 2009
Editors s.n.
Place of PublicationChristchurch, New Zealand
PublisherIEEE Society
Pages45-48
Number of pages4
ISBN (Print)978-1-4244-5335-1
Publication statusPublished - 2009
EventIEEE Sensors 2009 Conference - Christchurch, New Zealand
Duration: 25 Oct 200928 Oct 2009

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE Sensors 2009 Conference
CountryNew Zealand
CityChristchurch
Period25/10/0928/10/09

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Kashmiri, SM., & Makinwa, KAA. (2009). Measuring the thermal diffusivity of CMOS chips. In s.n. (Ed.), Proceedings of IEEE Sensors 2009 (pp. 45-48). IEEE Society.