Mechanical characterization of individual polycrystalline carbon tubes for use in electrical nano-interconnects

A Khiat; RH Poelma; GQ Zhang; FCA Heuck; FD Tichelaar; M Sarno; P Ciambelli; S Fontorbes; L Arurault; U Staufer

doi:10.1016/j.mee.2012.07.087

Mechanical characterization of individual polycrystalline carbon tubes for use in electrical nano-interconnects

A Khiat, RH Poelma, GQ Zhang, FCA Heuck, FD Tichelaar, M Sarno, P Ciambelli, S Fontorbes, L Arurault, U Staufer

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	317-320
Number of pages	4
Journal	Microelectronic Engineering
Volume	98
DOIs	https://doi.org/10.1016/j.mee.2012.07.087
Publication status	Published - 2012

Bibliographical note

Special Issue n.a.v. de 37th International Conference on Micro and Nano Engineering, september 2011 te Berlijn, Germany.

Keywords

academic journal papers
CWTS JFIS < 0.75

Access to Document

10.1016/j.mee.2012.07.087

Cite this

@article{1123f9446ff640e78ae776f0bf2e5910,

title = "Mechanical characterization of individual polycrystalline carbon tubes for use in electrical nano-interconnects",

keywords = "academic journal papers, CWTS JFIS < 0.75",

author = "A Khiat and RH Poelma and GQ Zhang and FCA Heuck and FD Tichelaar and M Sarno and P Ciambelli and S Fontorbes and L Arurault and U Staufer",

note = "Special Issue n.a.v. de 37th International Conference on Micro and Nano Engineering, september 2011 te Berlijn, Germany.",

year = "2012",

doi = "10.1016/j.mee.2012.07.087",

language = "English",

volume = "98",

pages = "317--320",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier",

}

TY - JOUR

T1 - Mechanical characterization of individual polycrystalline carbon tubes for use in electrical nano-interconnects

AU - Khiat, A

AU - Poelma, RH

AU - Zhang, GQ

AU - Heuck, FCA

AU - Tichelaar, FD

AU - Sarno, M

AU - Ciambelli, P

AU - Fontorbes, S

AU - Arurault, L

AU - Staufer, U

N1 - Special Issue n.a.v. de 37th International Conference on Micro and Nano Engineering, september 2011 te Berlijn, Germany.

PY - 2012

Y1 - 2012

KW - academic journal papers

KW - CWTS JFIS < 0.75

U2 - 10.1016/j.mee.2012.07.087

DO - 10.1016/j.mee.2012.07.087

M3 - Article

SN - 0167-9317

VL - 98

SP - 317

EP - 320

JO - Microelectronic Engineering

JF - Microelectronic Engineering

ER -